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Product Availability: 5 - 10 working days
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| Order | Request an official quote (RFQ) |
|---|
| Order Code, Price (EUR/GBP) | Probes per set |
|---|---|
| AR5-NCH-10 | 10 pcs |
| € 911.00 £ 802.00 |
|
| AR5-NCH-20 | 20 pcs |
| € 1629.00 £ 1434.00 |
|
| AR5-NCH-50 | 50 pcs |
| € 3594.00 £ 3163.00 |
|
| AR5-NCH-W | 370 pcs |
| € 18367.00 £ 16163.00 |
|
Product Availability: 5 - 10 working days
DANGER: One tiny amount of static electricity while you are handling these
probes will destroy the tip!
We highly recommend that you utilize an ESD
station and if you do not already have one, we have a mobile ESD station
for only £ ( EUR).
Considering the costs of these probes, this is a very wise investment.
AFM Probe type:
AR5-NCH
Manufacturer: NANOSENSORS
(https://www.nanosensors.com)
Product Description:
NANOSENSORS™ AR5-NCH AFM tips are designed for non-contact mode or tapping mode AFM. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored tips. These tips are FIB (Focused Ion Beam) milled to achieve a high aspect ratio portion better than 5:1 at the end of the common silicon tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the tip.
The probe offers unique features:
- length of the high aspect ratio portion of the tip > 2 µm
- typical aspect ratio at 2 µm in the order of 7:1 (when viewed from side as well as along cantilever axis)
- excellent tip radius of curvature
- monolithic tip
- highly doped silicon to dissipate static charge
- high mechanical Q-factor for high sensitivity
Application Modes:
AFM Probe Specifications:
AFM Tips:
| shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|
| High-Aspect-Ratio | 0 µm | 0 - 0 µm* | 0 µm ( 0 - 0 µm)* | < 15 nm guaranteed |
typically < 5° at 2 µm of the high aspect ratio portion |
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| Beam | 125 µm (115 - 135 µm)* | 30 µm (22.5 - 37.5 µm)* | 4 µm (3 - 5 µm)* | 42 N/m (10 - 130 N/m)* | 330 kHz (204 - 497 kHz)* | ||
* guaranteed range
**ScanAsyst® and Peak Force Tapping® are registered trademarks of Bruker Corporation.
*** Olympus® is a trademark of Olympus Corporation.
Apex Probes Ltd., 12th Floor, Ocean House, The Ring, Bracknell, RG12 1AX, Phone: +44 (0)1344 388016