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Product Availability: 5 - 10 working days
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| Order | Request an official quote (RFQ) |
|---|
| Order Code, Price (EUR/GBP) | Probes per set |
|---|---|
| ATEC-CONT-10 | 10 pcs |
| € 384.00 £ 338.00 |
|
| ATEC-CONT-20 | 20 pcs |
| € 686.00 £ 604.00 |
|
| ATEC-CONT-50 | 50 pcs |
| € 1513.00 £ 1331.00 |
|
Product Availability: 5 - 10 working days
DANGER: One tiny amount of static electricity while you are handling these
probes will destroy the tip!
We highly recommend that you utilize an ESD
station and if you do not already have one, we have a mobile ESD station
for only £ ( EUR).
Considering the costs of these probes, this is a very wise investment.
AFM Probe type:
ATEC-CONT
Manufacturer: NANOSENSORS
(https://www.nanosensors.com)
ATEC AFM top front view 
Product Description:
NANOSENSORS™ AdvancedTEC™ Cont AFM probes are designed for contact mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever. This unique feature allows precise positioning and makes the AdvancedTEC™ the only AFM scanning probe in the world that offers REAL TIP VISIBILITY FROM TOP, even when the probe is tilted due to its mounting onto the AFM head. This feature makes them the premium choice for all applications where the tip has to be placed exactly on the point of interest and/or has to be visible (e.g. Nanomanipulation).
Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.
The probe offers unique features:
- REAL TIP VISIBILITY FROM TOP
- excellent tip radius of curvature
- monolithic silicon
- highly doped silicon to dissipate static charge
- chemically inert
- high mechanical Q-factor for high sensitivity
AFM Probe Series:
Application Modes:
AFM Probe Specifications:
AFM Tips:
| shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|
| Visible | 0 µm (15 - 20 µm)* | 15 - 20 µm* | 0 µm ( 0 - 0 µm)* | < 10 nm |
< 12° along the cantilever axis < 8° seen from the side |
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| Beam | 450 µm (440 - 460 µm)* | 50 µm (45 - 55 µm)* | 2 µm (1 - 3 µm)* | 0.2 N/m (0.02 - 0.75 N/m)* | 15 kHz (7 - 25 kHz)* | ||
* guaranteed range
**ScanAsyst® and Peak Force Tapping® are registered trademarks of Bruker Corporation.
*** Olympus® is a trademark of Olympus Corporation.
Apex Probes Ltd., 12th Floor, Ocean House, The Ring, Bracknell, RG12 1AX, Phone: +44 (0)1344 388016