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Product Availability: 5 - 10 working days
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| Order | Request an official quote (RFQ) |
|---|
| Order Code, Price (EUR/GBP) | Probes per set |
|---|---|
| AIO-DD-5 | 5 pcs |
| € 670.00 £ 590.00 |
|
| AIO-DD-10 | 10 pcs |
| € 1150.00 £ 1012.00 |
|
| AIO-DD-20 | 20 pcs |
| € 1950.00 £ 1716.00 |
|
| AIO-DD-50 | 50 pcs |
| € 4400.00 £ 3872.00 |
|
Product Availability: 5 - 10 working days
AFM Probe type:
All-In-One-DD
Manufacturer: BudgetSensors
(https://www.budgetsensors.com)
Product Description:
Versatile monolithic silicon AFM probe with 4 different cantilevers on a single AFM holder chip for various applications: nanoindentation, nanolithography and electric modes such as:
- scanning capacitance microscopy (SCM)
- electrostatic force microscopy (EFM)
- Kelvin probe force microscopy (KFM)
- conductive atomic force microscopy (C-AFM).
The short cantilever end is marked by a trapezoidal pattern visible with bare eyes.
The doped polycristalline diamond tip coating provides unprecedented hardness and durability, as well as electridcal conductivity for demanding electrical applications. The resulting tip radius is in the range 100-250nm.
The rotated tips allow for more symmetric representation of high sample features.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose the right cantilever for each application in the very last moment. You do not need to stock various AFM probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the All-In-One cantilevers differs from the geometry of the comparable specialized single-cantilever AFM probes.
Please note that the aluminum back side coating is not suitable for measurements in liquids!
Consistent high quality at a lower price!
Application Modes:
AFM Probe Specifications:
AFM Tips:
| shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|
| Rotated | 17 µm (15 - 19 µm)* | 15 - 19 µm* | 15 µm ( 10 - 20 µm)* | < 250 nm | 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex |
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| 1Cantilever A - Contact Mode | Beam | 500 µm (490 - 510 µm)* | 30 µm (25 - 35 µm)* | 2.7 µm (1.7 - 3.7 µm)* | 0.5 N/m (0.2 - 0.9 N/m)* | 19 kHz (16 - 24 kHz)* | |
| 2Cantilever B - Force Modulation | Beam | 210 µm (200 - 220 µm)* | 30 µm (25 - 35 µm)* | 2.7 µm (1.7 - 3.7 µm)* | 6.5 N/m (3 - 12 N/m)* | 110 kHz (80 - 140 kHz)* | |
| 3Cantilever C - Soft Tapping | Beam | 150 µm (140 - 160 µm)* | 30 µm (25 - 35 µm)* | 2.7 µm (1.7 - 3.7 µm)* | 18 N/m (8 - 35 N/m)* | 200 kHz (140 - 260 kHz)* | |
| 4Cantilever D - Tapping Mode | Beam | 100 µm (90 - 110 µm)* | 50 µm (45 - 55 µm)* | 2.7 µm (1.7 - 3.7 µm)* | 100 N/m (48 - 190 N/m)* | 450 kHz (230 - 600 kHz)* | |
* typical range
Coating:
Boron doped polycrystalline diamond tip coating, 100 nm thick; Aluminum coating on detector side of the cantilever, 30 nm thick.
**ScanAsyst® and Peak Force Tapping® are registered trademarks of Bruker Corporation.
*** Olympus® is a trademark of Olympus Corporation.
Apex Probes Ltd., 12th Floor, Ocean House, The Ring, Bracknell, RG12 1AX, Phone: +44 (0)1344 388016