Your order will be processed in GBP.
[switch currency to EUR]

Order Request an official quote (RFQ)
Order Code, Price (EUR/GBP) Probes per set
AIODLC-10 10 pcs
€ 380.00 £ 334.00 add to shopping cart
AIODLC-50 50 pcs
€ 1600.00 £ 1408.00 add to shopping cart

Product Availability: 5 - 10 working days


AFM Probe type:

All-In-One-DLC

Manufacturer: BudgetSensors
Product Description:

Versatile silicon AFM probe with 4 different cantilevers on a single AFM holder chip. Rotated, monolithic silicon AFM probe with symmetric tip shape for various applications (contact mode, force modulation mode, tapping mode and soft tapping mode). The short cantilever end is marked by a trapezoidal pattern visible with bare eyes.

High durability and hydrophobicity due to Diamond-Like-Carbon coating on tip side of the cantilever.

The rotated tips allow for more symmetric representation of high sample features. The consistent tip radii ensure good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose in the very last moment the right cantilever for each application. You don't need to stock various AFM Probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the All-In-One cantilevers differs from the geometry of comparable specialized single-cantilever AFM probes.

Please note that the aluminum back side coating is not suitable for measurements in liquids!

Consistent high quality at a lower price!
Application Modes:
AFM Probe Specifications:
AFM Tips:
shape tip height tip set back tip radius full cone angle half cone angle
Rotated 17 µN/m (15 - 19 µN/m)* 15 - 19 µN/m* 15 µm ( 10 - 20 µm)* < 15 nm 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever(s):
cant. shape length width thickness force const. res. freq. probe base
1Cantilever A - Contact Mode Beam 500 µm (490 - 510 µm)* 30 µm (25 - 35 µm)* 2.7 µm (1.7 - 3.7 µm)* 0.2 µm (0.04 - 0.7 µm)* 15 µm (10 - 20 µm)*
2Cantilever B - Force Modulation Beam 200 µm (200 - 220 µm)* 30 µm (25 - 35 µm)* 2.7 µm (1.7 - 3.7 µm)* 2.7 N/m (0.4 - 10 N/m)* 80 kHz (50 - 110 kHz)*
3Cantilever C - Soft Tapping Beam 150 µm (140 - 160 µm)* 30 µm (25 - 35 µm)* 2.7 µm (1.7 - 3.7 µm)* 7.4 N/m (1 - 29 N/m)* 150 kHz (70 - 230 kHz)*
4Cantilever D - Tapping Mode Beam 100 µm (90 - 110 µm)* 50 µm (45 - 55 µm)* 2.7 µm (1.7 - 3.7 µm)* 40 N/m (7 - 160 N/m)* 350 kHz (200 - 500 kHz)*

* typical range

Coating:
Diamond-Like-Carbon coating on tip side of the cantilever, 15 nm thick; Aluminum coating on detector side of the cantilever, 30 nm thick

**ScanAsyst® and Peak Force Tapping® are registered trademarks of Bruker Corporation.
*** Olympus® is a trademark of Olympus Corporation.

Apex Probes Ltd., 12th Floor, Ocean House, The Ring, Bracknell, RG12 1AX, Phone: +44 (0)1344 388016

© 2018 - Apex Probes | design by ISB