CDT-CONTR

Product Description:

NANOSENSORS™ CDT-CONTR probes are designed for contact mode (repulsive mode) SPM imaging.

For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.

The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.

The probe offers unique features:

• real diamond coating, highly doped
• high mechanical Q-factor for high sensitivity

Application Modes:

• Conductive AFM Probes
• Diamond AFM Probes

AFM Probe Specifications:

AFM Tips:

shape	tip height	tip set back	tip radius	full cone angle	half cone angle
Standard	0 µm	0 - 0 µm*	0 µm ( 0 - 0 µm)*	< 200 nm guaranteed

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	Beam	450 µm (440 - 460 µm)*	50 µm (42.5 - 57.5 µm)*	2 µm (1 - 3 µm)*	0.5 N/m (0.1 - 1.7 N/m)*	20 kHz (11 - 29 kHz)*

* guaranteed range

Coating:

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 3.5% of the cantilever length.

Probes Datasheets:

Datasheet for all sensors with sets of 10 or 20 sensors.
Datasheet for up to 32 sensors with full wafer.