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Order Code, Price (EUR/GBP) Probes per set
CONTSC-10 10 pcs
€ 311.00 £ 274.00 add to shopping cart
CONTSC-20 20 pcs
€ 556.00 £ 489.00 add to shopping cart
CONTSC-50 50 pcs
€ 1226.00 £ 1079.00 add to shopping cart
CONTSC-W 380 pcs
€ 6528.00 £ 5745.00 add to shopping cart

Product Availability: 5 - 10 working days


AFM Probe type:

CONTSC

Manufacturer: NanoWorld
Product Description:
NanoWorld Pointprobe® CONTSC AFM probe is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.

All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this probes offers an excellent tip radius of curvature.

Application Modes:
AFM Probe Specifications:
AFM Tips:
shape tip height tip set back tip radius full cone angle half cone angle
Standard 0 µm (10 - 15 µm)* 10 - 15 µm* 0 µm ( 0 - 0 µm)* < 8 nm

AFM Cantilever(s):
cant. shape length width thickness force const. res. freq. probe base
Beam 225 µm (220 - 230 µm)* 48 µm (42.5 - 52.5 µm)* 1 µm (0.5 - 1.5 µm)* 0.2 N/m (0.02 - 0.7 N/m)* 25 kHz (10 - 39 kHz)*

* typical range

**ScanAsyst® and Peak Force Tapping® are registered trademarks of Bruker Corporation.
*** Olympus® is a trademark of Olympus Corporation.

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