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Order Code, Price (EUR/GBP) Probes per set
CP-NCH-SiO-A-5
sphere Ø = 2 µm
5 pcs
€ 530.00 £ 466.00 add to shopping cart
CP-NCH-SiO-B-5
sphere Ø = 3.5 µm
5 pcs
€ 530.00 £ 466.00 add to shopping cart
CP-NCH-SiO-C-5
sphere Ø = 6.62 µm
5 pcs
€ 530.00 £ 466.00 add to shopping cart
CP-NCH-SiO-D-5
sphere Ø = 10.2 µm
5 pcs
€ 530.00 £ 466.00 add to shopping cart
CP-NCH-SiO-E-5
sphere Ø = 15 µm
5 pcs
€ 530.00 £ 466.00 add to shopping cart

Product Availability: made-to-order, ~3 weeks delivery


AFM Probe type:

CP-NCH-SiO

Manufacturer: sQube
Product Description:

This colloidal probe combines the well-known features of the proven NANOSENSORS™ NCH series such as high application versatility and compatibility with most commercial SPMs with a reproducible sphere radius instead of a sharp tip.

NCH AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). 

The so called "Colloidal Probe Technique", where single colloids are attached with polymer glue to AFM cantilevers for force measurements, offers possibilities for a better understanding of fundamental interactions in a variety of fields. Examples are adhesion phenomena, particle-surface-interactions, mechanical properties, suspensions, hydrodynamics and boundary slip - to name just some out of an increasing number of applications.

The probe offers unique features:
  • sphere material: silicon dioxide (SiO2)
  • excellent sphere diameter: A = 2 µm, B = 3.5 µm, C = 6.62 µm, D = 10.2 µm, or E = 15 µm (all +/- 5%)
    (Due to different masses the resonance frequency can differ.)
    Please choose A, B, C, D, or E  when ordering!
  • highly doped silicon cantilever to dissipate static charge, chemically inert to most common solvents
  • high mechanical Q-factor for high sensitivity
  • precise alignment of the cantilever position when used together with the Alignment chip (within +/- 2 µm)
Application Modes:
AFM Probe Specifications:
AFM Tips:
shape tip height tip set back tip radius full cone angle half cone angle
Sphere µm µm* (

AFM Cantilever(s):
cant. shape length width thickness force const. res. freq. probe base
Beam 125 µm (115 - 135 µm)* 30 µm (22.5 - 37.5 µm)* 4 µm (3 - 5 µm)* 42 N/m (10 - 130 N/m)* 330 kHz (204 - 497 kHz)*

* typical range

Coating:
None

**ScanAsyst® and Peak Force Tapping® are registered trademarks of Bruker Corporation.
*** Olympus® is a trademark of Olympus Corporation.

Apex Probes Ltd., 12th Floor, Ocean House, The Ring, Bracknell, RG12 1AX, Phone: +44 (0)1344 388016

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