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Product Availability: 5 - 10 working days
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| Order | Request an official quote (RFQ) |
|---|
| Order Code, Price (EUR/GBP) | Probes per set |
|---|---|
| DDESP-10 | 10 pcs |
| € 1413.00 £ 1243.00 |
|
| DDESP-20 | 20 pcs |
| € 2528.00 £ 2225.00 |
|
| DDESP-50 | 50 pcs |
| € 5575.00 £ 4906.00 |
|
Product Availability: 5 - 10 working days
AFM Probe type:
DDESP
Manufacturer: NanoWorld
(https://www.nanoworld.com)
Product Description:
Original manufacturer type: NW-CDT-NCHR.NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
For applications that require hard contact between tip and sample this probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond. The typical macroscopic tip radius of curvature lies in the range between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.
The CDT features a conductive diamond coating. Some typical applications for this tip are Scanning Spreading Resistance Microscopy (SSRM), Tunneling AFM (Conducting AFM) and Scanning Capacitance Microscopy (SCM).
This probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Bruker Corporation, which acquired Veeco metrology business, is no longer selling the original probe which has always been manufactured by NanoWorld®.
Application Modes:
AFM Probe Specifications:
AFM Tips:
| shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|
| Standard | 0 µm (10 - 15 µm)* | 10 - 15 µm* | 0 µm ( 0 - 0 µm)* | < 200 nm guaranteed |
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| Beam | 125 µm (120 - 130 µm)* | 30 µm (25 - 35 µm)* | 4 µm (3.5 - 4.5 µm)* | 80 N/m (42 - 142 N/m)* | 400 kHz (280 - 510 kHz)* | ||
* typical range
Coating:
Conductive Diamond Coating / Aluminum Reflex CoatingThe conductive diamond coating consists of a 100 nm thick polycrystalline diamond layer deposited on the tip side of the cantilever resulting in an unsurpassed hardness of the tip. The coating is highly doped with boron which leads to a macroscopic resistivity of 0.003 - 0.005 Ohm•cm.
The aluminum reflex coating deposited on the detector side of the cantilever enhances the reflectance of the laser beam and prevents light from interfering within the cantilever.
Probes Datasheets:
Datasheet for all sensors with sets of 10 or 20 sensors.Datasheet for up to 32 sensors with full wafer.
**ScanAsyst® and Peak Force Tapping® are registered trademarks of Bruker Corporation.
*** Olympus® is a trademark of Olympus Corporation.
Apex Probes Ltd., 12th Floor, Ocean House, The Ring, Bracknell, RG12 1AX, Phone: +44 (0)1344 388016