ElectriMulti75-G

Product Description:

Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM), and electric modes such as:

• scanning capacitance microscopy (SCM)
• electrostatic force microscopy (EFM)
• Kelvin probe force microscopy (KFM)

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

Consistent high quality at a lower price!

Application Modes:

• Conductive AFM Probes
• OLYMPUS*** Replacement AFM Probes

AFM Probe Specifications:

AFM Tips:

shape	tip height	tip set back	tip radius	full cone angle	half cone angle
Rotated	17 µm (15 - 19 µm)*	15 - 19 µm*	15 µm ( 10 - 20 µm)*	< 25 nm		20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	Beam	225 µm (215 - 235 µm)*	28 µm (23 - 33 µm)*	3 µm (2 - 4 µm)*	3 N/m (1 - 7 N/m)*	75 kHz (60 - 90 kHz)*

* typical range

Coating:

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.