Multi75M-G, also known as MagneticMulti75-G

Product Description:

Monolithic silicon AFM probe for magnetic force microscopy (MFM). The cobalt alloy coated tip has a magnetic moment of roughly 10^-13 emu and coercivity of roughly 300 Oe.

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

Consistent high quality at a lower price!

Application Modes:

• Magnetic AFM Probes

AFM Probe Specifications:

AFM Tips:

shape	tip height	tip set back	tip radius	full cone angle	half cone angle
Rotated	17 µm (15 - 19 µm)*	15 - 19 µm*	15 µm ( 10 - 20 µm)*	< 60 nm		20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	Beam	225 µm (215 - 235 µm)*	28 µm (23 - 33 µm)*	3 µm (2 - 4 µm)*	3 N/m (1 - 7 N/m)*	75 kHz (60 - 90 kHz)*

* typical range

Coating:

Hard magnetic, medium momentum coating on tip side of the cantilever and aluminium reflex coating on detector side of the cantilever