NW-AR10-NCHR

Product Description:

NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

For measurements on samples with sidewall angles approaching 90° we offer specially tailored tips showing a high aspect ratio portion with near-vertical sidewalls.

These probes offer unique features:

• length of the high aspect ratio portion of the tip > 1.5 µm
• typical aspect ratio of this portion in the order of 12:1 (when viewed from side as well as along cantilever axis)
• half cone angle of the high aspect ratio portion typically < 2.8°
• excellent tip radius of curvature

Application Modes:

• High Aspect Ratio (HAR) AFM Probes

AFM Probe Specifications:

AFM Tips:

shape	tip height	tip set back	tip radius	full cone angle	half cone angle
High-Aspect-Ratio	µm (10 - 15 µm)*	10 - 15 µm*	(	< 10 nm

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	Beam	125 µm (120 - 130 µm)*	30 µm (25 - 35 µm)*	4 µm (3.5 - 4.5 µm)*	42 N/m (21 - 78 N/m)*	320 kHz (250 - 390 kHz)*

* typical range

Coating:

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.