PPP-CONTAu

Product Description:

The Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible tip radius as well as a more defined tip shape. The minimized variation in tip shape provides more reproducible images.

NANOSENSORS^™ PPP-CONTAu probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant. 

The probe offers unique features:

• metallic conductivity of the tip
• Au coating on both sides of the cantilever
• chemically inert

Please note: Wear at the tip can occur if operating in contact-, friction- or force modulation mode.

Application Modes:

• Conductive AFM Probes
• Life Science AFM Probes

AFM Probe Specifications:

AFM Tips:

shape	tip height	tip set back	tip radius	full cone angle	half cone angle
Standard	0 µm	0 - 0 µm*	0 µm ( 10 - 15 µm)*

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	Beam	450 µm (440 - 460 µm)*	50 µm (42.5 - 57.5 µm)*	2 µm (1 - 3 µm)*	0.2 N/m (0.02 - 0.77 N/m)*	13 kHz (6 - 21 kHz)*

* guaranteed range

Coating:

A metallic layer (Au) is coated on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts - the typical tip radius of curvature is less than 50nm. The detector side coating enhances the reflectivity of the laser beam by a factor of 2.5 and prevents light from interfering within the cantilever. The coating process is optimized for stress compensation. The bending of the cantilever due to stress is less than 3.5% of the cantilever length.

Probes Datasheets:

Datasheet for all AFM probes with sets of 10 or 20 probes