PPP-CONTR

Product Description:

The PointProbe^® Plus (PPP) combines the well-known features of the proven PointProbe^® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS^™ PPP-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The PPP-CONTR type is optimized for high sensitivity due to a low force constant.

The probe offers unique features:

• excellent tip radius of curvature
• highly doped silicon to dissipate static charge
• Al coating on detector side of cantilever
• high mechanical Q-factor for high sensitivity

Application Modes:

• Contact Mode AFM Probes

AFM Probe Specifications:

AFM Tips:

shape	tip height	tip set back	tip radius	full cone angle	half cone angle
Standard	0 µm (10 - 15 µm)*	10 - 15 µm*	0 µm ( 0 - 0 µm)*	< 7 nm (< 10 nm guaranteed)

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	Beam	450 µm (440 - 460 µm)*	50 µm (42.5 - 57.5 µm)*	2 µm (1 - 3 µm)*	0.2 N/m (0.02 - 0.77 N/m)*	13 kHz (6 - 21 kHz)*

* guaranteed range

Coating:

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.