Your order will be processed in GBP.
[switch currency to EUR]

Order Request an official quote (RFQ)
Order Code, Price (EUR/GBP) Probes per set
PPP-NCLAuD-10 10 pcs
€ 328.00 £ 289.00 add to shopping cart

Product Availability: 5 - 10 working days


AFM Probe type:

PPP-NCLAuD

Manufacturer: NANOSENSORS
Product Description:

The Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-NCLAuD probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to NANOSENSORS™ high frequency non contact type (NCH). PPP-NCLAuD is recommended if the feedback loop of the microscope does not accept high frequencies (400kHz) or if the detection system needs a minimum cantilever length >125µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

The probe offers unique features:

  • excellent tip radius of curvature
  • highly doped silicon to dissipate static charge
  • Au coating on detector side of cantilever
  • chemically inert
Application Modes:
AFM Probe Specifications:
AFM Tips:
shape tip height tip set back tip radius full cone angle half cone angle
Standard 0 µm (10 - 15 µm)* 10 - 15 µm* 0 µm ( 0 - 0 µm)* < 7 nm (< 10 nm guaranteed)

AFM Cantilever(s):
cant. shape length width thickness force const. res. freq. probe base
Beam 225 µm (215 - 235 µm)* 38 µm (30 - 45 µm)* 7 µm (6 - 8 µm)* 48 N/m (21 - 98 N/m)* 190 kHz (146 - 236 kHz)*

* guaranteed range

Coating:
A metallic layer (Au) is coated on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length.
Probes Datasheets:
Datasheet for all AFM probes with sets of 10 or 20 probes

**ScanAsyst® and Peak Force Tapping® are registered trademarks of Bruker Corporation.
*** Olympus® is a trademark of Olympus Corporation.

Apex Probes Ltd., 12th Floor, Ocean House, The Ring, Bracknell, RG12 1AX, Phone: +44 (0)1344 388016

© 2018 - Apex Probes | design by ISB