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Product Availability: 5 - 10 working days
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| Order | Request an official quote (RFQ) |
|---|
| Order Code, Price (EUR/GBP) | Probes per set |
|---|---|
| PPP-NCLR-10 | 10 pcs |
| € 328.00 £ 289.00 |
|
| PPP-NCLR-20 | 20 pcs |
| € 587.00 £ 517.00 |
|
| PPP-NCLR-50 | 50 pcs |
| € 1296.00 £ 1140.00 |
|
| PPP-NCLR-W | 380 pcs |
| € 6802.00 £ 5986.00 |
|
Product Availability: 5 - 10 working days
AFM Probe type:
PPP-NCLR
Manufacturer: NANOSENSORS
(https://www.nanosensors.com)
Product Description:
The PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-NCLR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to NANOSENSORS™ high frequency non contact type (NCH). PPP-NCLR is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
The probe offers unique features:
- excellent tip radius of curvature
- highly doped silicon to dissipate static charge
- Al coating on detector side of cantilever
- high mechanical Q-factor for high sensitivity
- precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
- compatible with PointProbe® Plus XY-Alignment Series
Application Modes:
AFM Probe Specifications:
AFM Tips:
| shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|
| Standard | 0 µm (10 - 15 µm)* | 10 - 15 µm* | 0 µm ( 0 - 0 µm)* | < 7 nm (< 10 nm guaranteed) |
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| Beam | 225 µm (215 - 235 µm)* | 38 µm (30 - 45 µm)* | 7 µm (6 - 8 µm)* | 48 N/m (21 - 98 N/m)* | 190 kHz (146 - 236 kHz)* | ||
* guaranteed range
Coating:
The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.
**ScanAsyst® and Peak Force Tapping® are registered trademarks of Bruker Corporation.
*** Olympus® is a trademark of Olympus Corporation.
Apex Probes Ltd., 12th Floor, Ocean House, The Ring, Bracknell, RG12 1AX, Phone: +44 (0)1344 388016