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Product Availability: 5 - 10 working days
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| Order | Request an official quote (RFQ) |
|---|
| Order Code, Price (EUR/GBP) | Probes per set |
|---|---|
| PPP-NCR-10 | 10 pcs |
| € 328.00 £ 289.00 |
|
| PPP-NCR-20 | 20 pcs |
| € 587.00 £ 517.00 |
|
| PPP-NCR-50 | 50 pcs |
| € 1296.00 £ 1140.00 |
|
| PPP-NCR-W | 380 pcs |
| € 6802.00 £ 5986.00 |
|
Product Availability: 5 - 10 working days
AFM Probe type:
PPP-NCR
Manufacturer: NANOSENSORS
(https://www.nanosensors.com)
Product Description:
The PointProbe® Plus (PPP) combines the well-known features such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-NCR AFM probes are especially designed with the same mechanical properties as the Olympus*** AC160 AFM probe for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode).This AFM probe combines high operation stability with outstanding sensitivity.
This AFM probe offers unique features:
- same typical frequency and force constant range as Olympus*** AC160
- excellent tip radius of curvature
- highly doped silicon to dissipate static charge
- Al coating on detector side of AFM cantilever
- high mechanical Q-factor for high sensitivity
Application Modes:
AFM Probe Specifications:
AFM Tips:
| shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|
| Standard | nm (10 - 15 nm)* | 10 - 15 nm* | ( | < 7 nm (< 10 nm guaranteed) |
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| Beam | 125 µm (115 - 135 µm)* | 29 µm (21.5 - 36.5 µm)* | 3.5 µm (2.5 - 4.5 µm)* | 26 N/m (10 - 58 N/m)* | 300 kHz (200 - 400 kHz)* | ||
* guaranteed range
Coating:
The reflex coating is an approximately 30nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. The virtually stress-free coating is bending the AFM cantilever less than 3.5% of the AFM cantilever length.
**ScanAsyst® and Peak Force Tapping® are registered trademarks of Bruker Corporation.
*** Olympus® is a trademark of Olympus Corporation.
Apex Probes Ltd., 12th Floor, Ocean House, The Ring, Bracknell, RG12 1AX, Phone: +44 (0)1344 388016