PtSi-NCH

Product Description:

NANOSENSORS™ PtSi-NCH probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

For applications that require a wear resistant and an electrically conductive tip we recommend this type. NANOSENSORS PtSi-NCH probes are suitable for C-AFM and Tunneling AFM.

The Platinum Silicide coating shows an excellent conductivity (almost approaching metal conductivity). The typical tip radius of curvature is around 25 nm.

The probe offers unique features:

• platinum silicide coating with excellent conductivity and good wear-out behavior
• chemically inert
• high mechanical Q-factor for high sensitivity

Application Modes:

• Conductive AFM Probes
• Platinum Silicide AFM Probes

AFM Probe Specifications:

AFM Tips:

shape	tip height	tip set back	tip radius	full cone angle	half cone angle
Standard			(	< 25 nm

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
		125 µm (115 - 135 µm)*	30 µm (22.5 - 37.5 µm)*	4 µm (3 - 5 µm)*	42 N/m (10 - 130 N/m)*	330 kHz (204 - 497 kHz)*

* guaranteed range

Coating:

Platinum silicide on both sides of the cantilever.

Probes Datasheets:

Datasheet for all sensors with sets of 10 or 20 sensors.
Datasheet for up to 32 sensors with full wafer.