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Order Code, Price (EUR/GBP) Probes per set
Q-EFM-10 10 pcs
€ 350.00 £ 308.00 add to shopping cart

Product Availability: Available on demand. Please contact us for availability!


AFM Probe type:

Q-EFM

Manufacturer: BudgetSensors
Product Description:
Premounted on a T-Plate for Quesant AFM systems.

Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM), and electric modes such as:

  • scanning capacitance microscopy (SCM)
  • electrostatic force microscopy (EFM)
  • Kelvin probe force microscopy (KFM)

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

Consistent high quality at a lower price!

Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a BudgetSensors ElectriMulti75-G AFM probe.
Application Modes:
AFM Probe Specifications:
AFM Tips:
shape tip height tip set back tip radius full cone angle half cone angle
Rotated 17 µm (15 - 19 µm)* 15 - 19 µm* 15 µm ( 10 - 20 µm)* < 10 nm 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever(s):
cant. shape length width thickness force const. res. freq. probe base
Beam 225 µm (215 - 235 µm)* 28 µm (23 - 33 µm)* 3 µm (2 - 4 µm)* 3 N/m (1 - 7 N/m)* 75 kHz (60 - 90 kHz)*

* typical range

Coating:
Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.

**ScanAsyst® and Peak Force Tapping® are registered trademarks of Bruker Corporation.
*** Olympus® is a trademark of Olympus Corporation.

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