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Product Availability: 5 - 10 working days
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| Order | Request an official quote (RFQ) |
|---|
| Order Code, Price (EUR/GBP) | Probes per set |
|---|---|
| SSS-MFMR-10 | 10 pcs |
| € 1214.00 £ 1068.00 |
|
| SSS-MFMR-20 | 20 pcs |
| € 2171.00 £ 1910.00 |
|
| SSS-MFMR-50 | 50 pcs |
| € 4791.00 £ 4216.00 |
|
Product Availability: 5 - 10 working days
DANGER: One tiny amount of static electricity while you are handling these
probes will destroy the tip!
We highly recommend that you utilize an ESD
station and if you do not already have one, we have a mobile ESD station
for only £ ( EUR).
Considering the costs of these probes, this is a very wise investment.
AFM Probe type:
SSS-MFMR
Manufacturer: NANOSENSORS
(https://www.nanosensors.com)
Product Description:
The NANOSENSORS™ SSS-MFMR AFM probe is optimized for high resolution magnetic force imaging. The SuperSharpSilicon™ tip basis combined with a very thin hard magnetic coating result in an extremely small radius of the coated tip and a high aspect ratio at the last few hundred nanometers of the tip - the essential demands for high lateral resolution down to 20 nm in ambient conditions.
Due to the low magnetic moment of the tip the sensitivity to magnetic forces is significantly decreased if compared to standard MFM probes but the disturbance of soft magnetic samples is also reduced.
The SPM probe offers unique features:
- hard magnetic coating on the tip side (coercivity of app. 125 Oe, remanence magnetization of app. 80 emu/cm3)
- effective magnetic moment 0.25x of standard probes
- metallic electrical conductivity
- excellent tip radius of curvature
- magnetic resolution better than 25 nm
- Al coating on detector side of cantilever enhancing the reflectivity of the laser beam by a factor of about 2.5
- precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
- compatible with PointProbe® Plus XY-Alignment Series
As both coatings are almost stress-free the bending of the cantilever due to stress is less than 3.5% of the cantilever length. For enhanced signal strength the magnetization of the tip by means of a strong permanent magnet prior to the measurement is recommended.
Application Modes:
AFM Probe Specifications:
AFM Tips:
| shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|
| Supersharp | 0 µm | 0 - 0 µm* | 0 µm ( 0 - 0 µm)* |
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| Beam | 225 µm (215 - 235 µm)* | 28 µm (20 - 35 µm)* | 3 µm (2 - 4 µm)* | 2.8 N/m (0.5 - 9.5 N/m)* | 75 kHz (45 - 115 kHz)* | ||
* guaranteed range
Coating:
The hard magnetic coating on the tip is characterized by a coercivity of app. 125 Oe and a remanence magnetization of app. 80 emu/cm3 (these values were determined on a flat surface).Probes Datasheets:
Datasheet for all sensors with sets of 10 or 20 sensors.Datasheet for up to 32 sensors with full wafer.
**ScanAsyst® and Peak Force Tapping® are registered trademarks of Bruker Corporation.
*** Olympus® is a trademark of Olympus Corporation.
Apex Probes Ltd., 12th Floor, Ocean House, The Ring, Bracknell, RG12 1AX, Phone: +44 (0)1344 388016