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| Order | Request an official quote (RFQ) |
|---|
| Order Code, Price (EUR/GBP) | Probes per set |
|---|---|
| SSS-QMFMR-10 | 10 pcs |
| € 1366.00 £ 1202.00 |
|
Product Availability: 5 - 10 working days
DANGER: One tiny amount of static electricity while you are handling these
probes will destroy the tip!
We highly recommend that you utilize an ESD
station and if you do not already have one, we have a mobile ESD station
for only £ ( EUR).
Considering the costs of these probes, this is a very wise investment.
AFM Probe type:
SSS-QMFMR
Manufacturer: NANOSENSORS
(https://www.nanosensors.com)
Product Description:
The NANOSENSORS™ SSS-QMFMR AFM probe combines the high resolution performance of the SuperSharpSilicon™ magnetic force microscopy probe with the high mechanical quality factor under ultra high vacuum conditions of the Q30K-Plus-Series. An extremely small radius of the coated tip, a high aspect ratio at the last few hundred nanometers of the tip and a Q-factor of more than 35,000 facilitates outstanding lateral resolution in the magnetic force image and high operation stability under UHV conditions.
Due to the low magnetic moment of the tip the sensitivity to magnetic forces is decreased if compared to standard MFM probe but the disturbance of soft magnetic samples is also reduced.
The SPM probe offers unique features:- hard magnetic coating on the tip side (coercivity of app. 125 Oe, remanence magnetization of app. 80 emu/cm3)
- effective magnetic moment 0.25x of standard probes
- metallic electrical conductivity
- excellent tip radius of curvature
- magnetic resolution better than 25 nm
- Al coating on detector side of cantilever enhancing the reflectivity of the laser beam by a factor of about 2.5
- excellent mechanical Q-factor under UHV conditions for high sensitivity
- precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
- compatible with PointProbe® Plus XY-Alignment Series
As both coatings are almost stress-free the bending of the cantilever due to stress is less than 3.5% of the cantilever length. For enhanced signal strength the magnetization of the tip by means of a strong permanent magnet prior to the measurement is recommended.
Application Modes:
AFM Probe Specifications:
AFM Tips:
| shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|
| Supersharp | 0 µm | 0 - 0 µm* | 0 µm ( 0 - 0 µm)* |
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| Beam | 225 µm (215 - 235 µm)* | 28 µm (20 - 35 µm)* | 3 µm (2 - 4 µm)* | 2.8 N/m (0.5 - 9.5 N/m)* | 75 kHz (45 - 115 kHz)* | ||
* guaranteed range
Coating:
The hard magnetic coating on the tip is characterized by a coercivity of app. 125 Oe and a remanence magnetization of app. 80 emu/cm3 (these values were determined on a flat surface).Probes Datasheets:
Datasheet for all AFM probes with sets of 10 or 20 probes
**ScanAsyst® and Peak Force Tapping® are registered trademarks of Bruker Corporation.
*** Olympus® is a trademark of Olympus Corporation.
Apex Probes Ltd., 12th Floor, Ocean House, The Ring, Bracknell, RG12 1AX, Phone: +44 (0)1344 388016