Tap300GD-G

Product Description:

Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation.

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

Consistent high quality at a lower price!

Application Modes:

• Non-Contact / Tapping Mode AFM Probes
• Life Science AFM Probes

AFM Probe Specifications:

AFM Tips:

shape	tip height	tip set back	tip radius	full cone angle	half cone angle
Rotated	17 µm (15 - 19 µm)*	15 - 19 µm*	15 µm ( 10 - 20 µm)*	< 10 nm		20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	Beam	125 µm (115 - 135 µm)*	30 µm (25 - 35 µm)*	4 µm (3 - 5 µm)*	40 N/m (20 - 75 N/m)*	300 kHz (200 - 400 kHz)*

* typical range

Coating:

Gold coating on detector side of the cantilever, 70 nm thick