XNC12/Cr-Au

Product Description:

Probes of the 12 series have 2 silicon nitride cantilevers and tips on a glass holder chip. They are used for soft contact mode applications.

Probes with a conductive, chemically inert 35 nm Cr-Au coating on the tip side of the cantilever and 70 nm Cr-Au coating on the back side of the cantilever. Resulting tip radius is about 30 nm. The coating may cause cantilever bending within 2°.

Application Modes:

• Silicon Nitride AFM Probes
• Life Science AFM Probes

AFM Probe Specifications:

AFM Tips:

shape	tip height	tip set back	tip radius	full cone angle	half cone angle
Pyramid	3.5 µm	µm*	(	< 30 nm	40°

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
1Cantilever A	Triangle	200 µm (190 - 210 µm)*	28 µm (23 - 33 µm)*	500 nm (425 - 575 nm)*	0.08 N/m	17 kHz
2Cantilever B	Triangle	100 µm (90 - 110 µm)*	13.5 µm (8.5 - 18.5 µm)*	500 nm (425 - 575 nm)*	0.32 N/m	67 kHz

* typical range

Coating:

Cr-Au coating is formed as an Au film on a Cr sublayer, which is deposited for better adhesion of Au. The coating thickness is 70 nm on the backside of the cantilever and 35 nm on the tipside of the cantilever.