HQ:CSC38/tipless/No Al

Product Description:

Probes of the 38/tipless series have three different tipless contact mode cantilevers on one side of the holder chip. They can be used in various applications.

Application Modes:

• Tipless AFM Cantilevers and Cantilever Arrays

AFM Probe Specifications:

AFM Tips:

shape	tip height	tip set back	tip radius	full cone angle	half cone angle
Tipless			(

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
1Cantilever A	Beam	250 µm (245 - 255 µm)*	32.5 µm (29.5 - 35.5 µm)*	1 µm (0.5 - 1.5 µm)*	0.09 N/m (0.01 - 0.36 N/m)*	20 kHz (8 - 32 kHz)*
2Cantilever B	Beam	350 µm (345 - 355 µm)*	32.5 µm (29.5 - 35.5 µm)*	1 µm (0.5 - 1.5 µm)*	0.03 N/m (0.003 - 0.13 N/m)*	10 kHz (5 - 17 kHz)*
3Cantilever C	Beam	300 µm (295 - 305 µm)*	32.5 µm (29.5 - 35.5 µm)*	1 µm (0.5 - 1.5 µm)*	0.05 N/m (0.005 - 0.21 N/m)*	14 kHz (6 - 23 kHz)*

* typical range