HQ:CSC17/Hard/Al BS

Product Description:

Cantilevers of the 17 series with the low spring constant are used in contact mode AFM mostly. It is possible to adjust the scanning parameters to minimize the tip-sample force. Imaging in tapping mode gives the true topography of the soft samples.

A wear-resistant coating with thickness 20 nm is applied to the tipside of the cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer.

Application Modes:

• Hardened / Enhanced Wear Resistance AFM Probes
• Nanoindentation and Lithography AFM Probes

AFM Probe Specifications:

AFM Tips:

shape	tip height	tip set back	tip radius	full cone angle	half cone angle
Rotated	15 µm (12 - 18 µm)*	12 - 18 µm*	(	< 20 nm	40°

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	Beam	450 µm (445 - 455 µm)*	50 µm (47 - 53 µm)*	2 µm (1.5 - 2.5 µm)*	0.18 N/m (0.06 - 0.4 N/m)*	13 kHz (10 - 17 kHz)*

* typical range

Coating:

Wear-resistant coating with thickness 20 nm on the tipside of the cantilever. Al coating with thickness 30nm on the backside of the cantilever.