HQ:DMD-XSC11

Product Description:

Probes of the 11 series have four different cantilevers, two on each side of the holder chip. They can be used in various applications.

Wear resistant and electrically conductive doped diamond coating with thickness around 100 nm on the tipside of the cantilever. Al coating with thickness 30nm on the backside of the cantilever.

Application Modes:

• Conductive AFM Probes
• Diamond AFM Probes

AFM Probe Specifications:

AFM Tips:

shape	tip height	tip set back	tip radius	full cone angle	half cone angle
Rotated	15 µm (12 - 18 µm)*	12 - 18 µm*	(	< 250 nm	40°

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
1Cantilever A	Beam	500 µm (495 - 505 µm)*	30 µm (27 - 33 µm)*	2.7 µm (2.2 - 3.2 µm)*	0.5 N/m (0.25 - 1 N/m)*	18 kHz (15 - 22 kHz)*
2Cantilever B	Beam	210 µm (205 - 215 µm)*	30 µm (27 - 33 µm)*	2.7 µm (2.2 - 3.2 µm)*	6.5 N/m (3.5 - 10 N/m)*	110 kHz (90 - 130 kHz)*
3Cantilever C	Beam	150 µm (145 - 155 µm)*	30 µm (27 - 33 µm)*	2.7 µm (2.2 - 3.2 µm)*	18 N/m (10 - 30 N/m)*	210 kHz (170 - 250 kHz)*
4Cantilever D	Beam	100 µm (95 - 105 µm)*	50 µm (47 - 63 µm)*	2.7 µm (2.2 - 3.2 µm)*	95 N/m (55 - 175 N/m)*	450 kHz (350 - 575 kHz)*

* typical range

Coating:

Wear resistant and electrically conductive doped diamond coating with thickness around 100 nm on the tipside of the cantilever. Al coating with thickness 30nm on the backside of the cantilever.