HQ:NSC14/Cr-Au BS

Product Description:

Cantilevers of the 14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by tip tapping. Probes with coatings can also be used in conductive AFM techniques.

Application Modes:

• Non-Contact / Tapping Mode AFM Probes
• Life Science AFM Probes

AFM Probe Specifications:

AFM Tips:

shape	tip height	tip set back	tip radius	full cone angle	half cone angle
Rotated	15 µm (12 - 18 µm)*	12 - 18 µm*	(	< 8 nm	40°

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	Beam	125 µm (120 - 130 µm)*	25 µm (22 - 28 µm)*	2.1 µm (1.6 - 2.6 µm)*	5 N/m (1.8 - 13 N/m)*	160 kN/m (110 - 220 kN/m)*

* typical range

Coating:

Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on the backside of the cantilever.