HQ:NSC14/Pt

Product Description:

Cantilevers of the 14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by tip tapping. Probes with coatings can also be used in conductive AFM techniques.

Probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the cantilever. Resulting probe tip radius is about 30 nm.

Application Modes:

• Conductive AFM Probes

AFM Probe Specifications:

AFM Tips:

shape	tip height	tip set back	tip radius	full cone angle	half cone angle
Rotated	15 µm (12 - 18 µm)*	12 - 18 µm*	(	< 30 nm	40 °

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	Beam	125 µm (120 - 130 µm)*	25 µm (22 - 28 µm)*	2.1 µm (1.6 - 2.6 µm)*	5 N/m (1.8 - 13 N/m)*	160 kHz (110 - 220 kHz)*

* typical range

Coating:

The 30 nm conducting Pt coating is continuous from the tip end to the bulk of the Silicon chip. The coating covers both the tip and the back side.