HQ:NSC18/Co-Cr/Al BS

Product Description:

Cantilevers of the 18 series are optimal for the Lift mode operation AFM as they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These cantilevers are also used for mapping of materials properties in Force modulation mode and the true topography imaging of the soft samples.

The coating consists of a Co layer on the tipside of the cantilever. The Co layer is formed as a polycrystalline film, which allows steady permanent magnetization in the direction of the tip axis. All chips are pre-magnetized at the facility before shipping to end users. In some cases additional magnetization by an arbitrary strong magnet is required, e.g. SmCo or NdFeB.

The Co coating is protected from oxidation by a thin Cr layer, resulting in longer cantilever performance.

Application Modes:

• Magnetic AFM Probes

AFM Probe Specifications:

AFM Tips:

shape	tip height	tip set back	tip radius	full cone angle	half cone angle
Rotated	15 µm (12 - 18 µm)*	12 - 18 µm*	(	< 60 nm	40°

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	Beam	225 µm (220 - 230 µm)*	27.5 µm (24.5 - 30.5 µm)*	3 µm (2.5 - 3.5 µm)*	2.8 N/m (1.2 - 5.5 N/m)*	75 kHz (60 - 90 kHz)*

* typical range

Coating:

Co and Cr layer on the tipside of the cantilever. Aluminum coating with thickness 30 nm on the backside of the cantilever.