HQ:NSC18/Cr-Au BS

Product Description:

Cantilevers of the 18 series are optimal for the Lift mode operation AFM as they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These cantilevers are also used for mapping of materials properties in Force modulation mode and the true topography imaging of the soft samples.

Application Modes:

• Force Modulation (FM) AFM Probes
• Life Science AFM Probes
• Non-Contact / Soft Tapping Mode AFM Probes
• Fluid Tapping AFM Probes

AFM Probe Specifications:

AFM Tips:

shape	tip height	tip set back	tip radius	full cone angle	half cone angle
Rotated	15 µm (12 - 18 µm)*	12 - 18 µm*	(	< 8 nm	40°

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	Beam	225 µm (220 - 230 µm)*	27.5 µm (24.5 - 30.5 µm)*	3 µm (2.5 - 3.5 µm)*	2.8 N/m (1.2 - 5.5 N/m)*	75 kHz (60 - 90 kHz)*

* typical range

Coating:

Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on the backside of the cantilever.