HQ:NSC19/Cr-Au

Product Description:

Cantilevers of the 19 series combine the high frequency and low spring constant, which makes them applicable to imaging soft and fragile surfaces at a relatively high speed in Tapping mode. They are compatible with Bruker ScanAsyst® PeakForce Tapping™**. The cantilevers may also be useful in LFM due to the high sensitivity to the lateral forces.

Probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and backside of the cantilever. Resulting tip radius is below 35 nm. The coating may cause cantilever bending within 3°.

Application Modes:

• Conductive AFM Probes
• Life Science AFM Probes
• Fluid Tapping AFM Probes

AFM Probe Specifications:

AFM Tips:

shape	tip height	tip set back	tip radius	full cone angle	half cone angle
Rotated	15 µm (12 - 18 µm)*	12 - 18 µm*	(	< 35 nm	40°

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	Beam	125 µm (120 - 130 µm)*	22.5 µm (19.5 - 25.5 µm)*	1 µm (0.5 - 1.5 µm)*	0.5 N/m (0.05 - 2.3 N/m)*	65 kHz (25 - 120 kHz)*

* typical range

Coating:

Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on both tip side and backside of the cantilever.