HQ:NSC35/Hard/Al BS

Product Description:

Probes of the 35 series have three different tapping mode cantilevers on one side of the holder chip. They can be used in various applications.

A wear-resistant coating with thickness 20 nm is applied to the tipside of the cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer.

Application Modes:

• Hardened / Enhanced Wear Resistance AFM Probes
• Nanoindentation and Lithography AFM Probes
• Hardened / Enhanced Wear Resistance Tapping AFM Probes

AFM Probe Specifications:

AFM Tips:

shape	tip height	tip set back	tip radius	full cone angle	half cone angle
Rotated	15 µm (12 - 18 µm)*	12 - 18 µm*	(	< 20 nm	40°

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
1Cantilever A	Beam	110 µm (105 - 115 µm)*	35 µm (32 - 38 µm)*	2 µm (1.5 - 2.5 µm)*	8.9 N/m (2.7 - 24 N/m)*	205 kHz (130 - 290 kHz)*
2Cantilever B	Beam	90 µm (85 - 95 µm)*	35 µm (32 - 38 µm)*	2 µm (1.5 - 2.5 µm)*	16 N/m (4.8 - 44 N/m)*	300 kHz (185 - 430 kHz)*
3Cantilever C	Beam	130 µm (125 - 135 µm)*	35 µm (32 - 38 µm)*	2 µm (1.5 - 2.5 µm)*	5.4 N/m (1.7 - 14 N/m)*	150 kHz (95 - 205 kHz)*

* typical range

Coating:

Wear-resistant coating with thickness 20 nm on the tipside of the cantilever. Al coating with thickness 30nm on the backside of the cantilever.