HQ:NSC36/Co-Cr/Al BS

Product Description:

Probes of the 36 series have three different force modulation mode cantilevers on one side of the holder chip.

The coating consists of a Co layer on the tipside of the cantilever. The Co layer is formed as a polycrystalline film, which allows steady permanent magnetization in the direction of the tip axis. All chips are pre-magnetized at the facility before shipping to end users. In some cases additional magnetization by an arbitrary strong magnet is required, e.g. SmCo or NdFeB.

The Co coating is protected from oxidation by a thin Cr layer, resulting in longer cantilever performance.

Application Modes:

• Magnetic AFM Probes

AFM Probe Specifications:

AFM Tips:

shape	tip height	tip set back	tip radius	full cone angle	half cone angle
Rotated	15 µm (12 - 18 µm)*	12 - 18 µm*	(	< 60 nm	40°

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
1Cantilever A	Beam	110 µm (105 - 115 µm)*	32.5 µm (29.5 - 35.5 µm)*	1 µm (0.5 - 1.5 µm)*	1 N/m (0.1 - 4.6 N/m)*	60 kHz (30 - 160 kHz)*
2Cantilever B	Beam	90 µm (85 - 95 µm)*	32.5 µm (29.5 - 35.5 µm)*	1 µm (0.5 - 1.5 µm)*	2 N/m (0.2 - 9 N/m)*	130 kHz (45 - 240 kHz)*
3Cantilever C	Beam	130 µm (125 - 135 µm)*	32.5 µm (29.5 - 35.5 µm)*	1 µm (0.5 - 1.5 µm)*	0.6 N/m (0.06 - 2.7 N/m)*	65 kHz (25 - 115 kHz)*

* typical range

Coating:

Co and Cr layer on the tipside of the cantilever. Aluminum coating with thickness 30 nm on the backside of the cantilever.