HQ:NSC36/Cr-Au BS

Product Description:

Probes of the 36 series have three different force modulation mode cantilevers on one side of the holder chip. They can be used in various applications.

Application Modes:

• Life Science AFM Probes
• Force Modulation (FM) AFM Probes
• Fluid Tapping AFM Probes

AFM Probe Specifications:

AFM Tips:

shape	tip height	tip set back	tip radius	full cone angle	half cone angle
Rotated	15 µm (12 - 18 µm)*	12 - 18 µm*	(	< 8 nm	40°

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
1Cantilever A	Beam	110 µm (105 - 115 µm)*	32.5 µm (29.5 - 35.5 µm)*	1 µm (0.5 - 1.5 µm)*	1 N/m (0.1 - 4.6 N/m)*	90 kHz (30 - 160 kHz)*
2Cantilever B	Beam	90 µm (85 - 95 µm)*	32.5 µm (29.5 - 35.5 µm)*	1 µm (0.5 - 1.5 µm)*	2 N/m (0.2 - 9 N/m)*	130 kHz (45 - 240 kHz)*
3Cantilever C	Beam	130 µm (125 - 135 µm)*	32.5 µm (29.5 - 35.5 µm)*	1 µm (0.5 - 1.5 µm)*	0.6 N/m (0.06 - 2.7 N/m)*	65 kHz (25 - 115 kHz)*

* typical range

Coating:

Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on the backside of the cantilever.