HQ:XSC11/Al BS

Product Description:

Probes of the 11 series have four different cantilevers, two on each side of the holder chip. They can be used in various applications.

Application Modes:

• Non-Contact / Tapping Mode AFM Probes
• Force Modulation (FM) AFM Probes
• Contact Mode AFM Probes

AFM Probe Specifications:

AFM Tips:

shape	tip height	tip set back	tip radius	full cone angle	half cone angle
Rotated	15 µm (12 - 18 µm)*	12 - 18 µm*	(	< 8 nm	40°

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
1Cantilever A	Beam	500 µm (495 - 505 µm)*	30 µm (27 - 33 µm)*	2.7 µm (2.2 - 3.2 µm)*	0.2 N/m (0.1 - 0.4 N/m)*	15 kHz (12 - 18 kHz)*
2Cantilever B	Beam	210 µm (205 - 215 µm)*	30 µm (27 - 33 µm)*	2.7 µm (2.2 - 3.2 µm)*	2.7 N/m (1.1 - 5.6 N/m)*	80 kHz (60 - 100 kHz)*
3Cantilever C	Beam	150 µm (145 - 155 µm)*	30 µm (27 - 33 µm)*	2.7 µm (2.2 - 3.2 µm)*	7 N/m (3 - 16 N/m)*	155 kHz (115 - 200 kHz)*
4Cantilever D	Beam	100 µm (95 - 105 µm)*	50 µm (45 - 55 µm)*	2.7 µm (2.2 - 3.2 µm)*	42 N/m (17 - 90 N/m)*	350 kHz (250 - 465 kHz)*

* typical range

Coating:

Backside Al coated. Coating thickness - 30 nm.