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Product Availability: 5 - 10 working days
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| Order | Request an official quote (RFQ) |
|---|
| Order Code, Price (EUR/GBP) | Probes per set |
|---|---|
| qp-HBC-10 | 10 pcs |
| € 356.00 £ 313.00 |
|
| qp-HBC-20 | 20 pcs |
| € 629.00 £ 554.00 |
|
| qp-HBC-50 | 50 pcs |
| € 1395.00 £ 1228.00 |
|
Product Availability: 5 - 10 working days
DANGER: One tiny amount of static electricity while you are handling these
probes will destroy the tip!
We highly recommend that you utilize an ESD
station and if you do not already have one, we have a mobile ESD station
for only £ ( EUR).
Considering the costs of these probes, this is a very wise investment.
AFM Probe type:
qp-HBC
Manufacturer: NANOSENSORS
(https://www.nanosensors.com)
SEM image of a qp-HBC cantilever 3D view 
Product Description:
NANOSENSORS qp-HBC AFM probes are designed for use in ScanAsyst® or PeakForceTapping™** in air. The qp-HBC probes are also compatible for contact and non-contact or soft tapping mode AFM imaging The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction.
The NANOSENSORS uniqprobe combines the well-known features of the other NANOSENSORS AFM probe series such as high application versatility and compatibility with most commercial SPMs with the additional advantage of a strongly reduced dispersion of force constant and resonance frequency.
The unsurpassed uniformity of the mechanical characteristics of the uniqprobe series is particularly important for applications, where a large number of probes with known and near identical force constants or resonance frequencies are needed.
The probe offers unique features:
- compatible for use in ScanAsyst® or PeakForceTapping™** in air
- small dispersion of force constant and resonance frequency
- circular symmetric tip shape with a hyperbolic profile
- typical tip height 7µm
- typical tip radius of curvature smaller than 10nm
- Al coating on detector side of cantilever
- tip and cantilevers are made of a quartz-like material
- alignment grooves on backside of silicon holder chip
- tip repositioning accuracy of better than ± 8µm (in combination with Alignment Chip)
- chemically inert
Application Modes:
AFM Probe Specifications:
AFM Tips:
| shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|
| Circular symmetric | 7 µm (5.5 - 8.5 µm)* | 5.5 - 8.5 µm* | ( | < 10 (< 15 guaranteed) |
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| Triangle | 115 µm (110 - 120 µm)* | 25 µm (24 - 26 µm)* | 1000 nm (970 - 1030 nm)* | 0.5 N/m (0.35 - 0.8 N/m)* | 60 kHz (45 - 75 kHz)* | ||
* guaranteed range
Coating:
The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 3.5% of the cantilever length.Probes Datasheets:
Datasheet for all sensors with sets of 10 or 20 sensors.Datasheet for up to 32 sensors with full wafer.
**ScanAsyst® and Peak Force Tapping® are registered trademarks of Bruker Corporation.
*** Olympus® is a trademark of Olympus Corporation.
Apex Probes Ltd., 12th Floor, Ocean House, The Ring, Bracknell, RG12 1AX, Phone: +44 (0)1344 388016