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Product Availability: 5 - 10 working days
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| Order | Request an official quote (RFQ) |
|---|
| Order Code, Price (EUR/GBP) | Probes per set |
|---|---|
| qp-SCONT-10 | 10 pcs |
| € 356.00 £ 313.00 |
|
| qp-SCONT-20 | 20 pcs |
| € 629.00 £ 554.00 |
|
| qp-SCONT-50 | 50 pcs |
| € 1395.00 £ 1228.00 |
|
Product Availability: 5 - 10 working days
DANGER: One tiny amount of static electricity while you are handling these
probes will destroy the tip!
We highly recommend that you utilize an ESD
station and if you do not already have one, we have a mobile ESD station
for only £ ( EUR).
Considering the costs of these probes, this is a very wise investment.
AFM Probe type:
qp-SCONT
Manufacturer: NANOSENSORS
(https://www.nanosensors.com)
SEM image of a SCONT uniqprobe cantilever (side view)
Product Description:
The NANOSENSORS uniqprobe combines the well-known features of the other NANOSENSORS AFM probe series such as high application versatility and compatibility with most commercial SPMs with the additional advantage of a strongly reduced dispersion of force constant and resonance frequency.
The unsurpassed uniformity of the mechanical characteristics of the uniqprobe series is particularly important for applications, where a large number of probes with known and near identical force constants or resonance frequencies are needed. The sensors of the uniqprobe series are especially adapted for molecular biology, biophysics and quantitative nano-mechanical studies.
NANOSENORS qp-SCONT AFM probes are designed for contact mode AFM imaging in air or liquid environments. The SCONT type features a very low force constant offering the possibility of contact mode measurements on soft biological materials with high sensitivity.
The probe offers unique features:
- small dispersion of force constant and resonance frequency
- typical tip height 7µm
- typical tip radius of curvature smaller than 10nm
- stress free cantilevers with considerably less bending
- tip and cantilevers are made of a quartz-like material
- reduced drift for applications in liquid environments
- tip repositioning accuracy of better than ± 8 µm (in combination with Alignment Chip)
- chemically inert
Application Modes:
AFM Probe Specifications:
AFM Tips:
| shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|
| Circular symmetric | 7 µm (5.5 - 8.5 µm)* | 5.5 - 8.5 µm* | ( | < 10 nm (< 15 nm guaranteed) |
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| Beam | 125 µm (120 - 130 µm)* | 34 µm (32 - 36 µm)* | 350 nm (320 - 380 nm)* | 0.01 N/m (0.006 - 0.015 N/m)* | 11 kHz (8 - 13 kHz)* | ||
* guaranteed range
Coating:
A chromium/gold layer of about 60nm is partially coating the cantilever on the detector side near its free end where the tip is situated. The main advantages of this partial metallic coating are considerably less cantilever bending and reduced drift for SPM measurements in liquid environments.Probes Datasheets:
Datasheet for all sensors with sets of 10 or 20 sensors.Datasheet for up to 32 sensors with full wafer.
**ScanAsyst® and Peak Force Tapping® are registered trademarks of Bruker Corporation.
*** Olympus® is a trademark of Olympus Corporation.
Apex Probes Ltd., 12th Floor, Ocean House, The Ring, Bracknell, RG12 1AX, Phone: +44 (0)1344 388016