160AC-NG

Product Description:

The 160AC series is designed primarily for standard AC mode AFM imaging in air or vacuum. The uncoated tip offers a sharp tip apex and chemical inertness.  The back side gold coating ensures high and stable laser reflectivity in air, liquid and aggressive chemical environments. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.

Application Modes:

• Non-Contact / Tapping Mode AFM Probes
• Life Science AFM Probes
• OLYMPUS*** Replacement AFM Probes

AFM Probe Specifications:

AFM Tips:

shape	tip height	tip set back	tip radius	full cone angle	half cone angle
OPUS	14 µm (12 - 16 µm)*	12 - 16 µm*	µm ( µm)*	< 7 nm		0° front, 35° back, <9° side

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	Beam	160 µm (150 - 170 µm)*	40 µm (38 - 42 µm)*	4 µm (3.5 - 4.5 µm)*	26 N/m (8 - 57 N/m)*	300 kHz (200 - 400 kHz)*

* typical range

Coating:

70 nm Au on the back side of the cantilever