3XC-NA

Product Description:

The 3XC series features three different cantilevers for various measurement modes:

• 500DC - Contact mode cantilever
• 200AC - Standard AC mode cantilever
• 240AC - Soft AC mode cantilever for imaging soft samples

The uncoated tips offer sharp tip apexes, chemical inertness and high Quality factors. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tips are located precisely at the free ends of the cantilevers. This allows the tips to be positioned accurately over the area of interest on the sample surface.

Application Modes:

• Non-Contact / Tapping Mode AFM Probes
• Force Modulation (FM) AFM Probes
• Contact Mode AFM Probes
• OLYMPUS*** Replacement AFM Probes

AFM Probe Specifications:

AFM Tips:

shape	tip height	tip set back	tip radius	full cone angle	half cone angle
OPUS	14 µm (12 - 16 µm)*	12 - 16 µm*	(	< 7 nm		0° front, 35° back, <9° side

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
1Contact mode cantilever	Beam	500 µm (490 - 510 µm)*	30 µm (28 - 32 µm)*	3 µm (2.5 - 3.5 µm)*	0.3 N/m (0.1 - 0.6 N/m)*	17 kHz (11 - 22 kHz)*
2Standard tapping mode cantilever	Beam	175 µm (165 - 185 µm)*	40 µm (38 - 42 µm)*	3 µm (2.5 - 3.5 µm)*	9 N/m (2.8 - 21 N/m)*	150 kHz (100 - 200 kHz)*
3Soft tapping mode cantilever	Beam	240 µm (230 - 250 µm)*	30 µm (28 - 32 µm)*	3 µm (2.5 - 3.5 µm)*	2.5 N/m (0.75 - 5.3 N/m)*	75 kHz (50 - 100 kHz)*

* typical range

Coating:

30 nm Al on the back side of the cantilever