4XC-GG

Product Description:

The 4XC series features four different cantilevers for various measurement modes, two on each side of the holder chip:

500DC - Contact mode cantilever

240AC - Soft AC mode cantilever for imaging soft samples

200AC - Standard AC mode cantilever

65AC - High resonance frequency cantilever for High speed scanning

The gold coated version is suitable for biological applications, tip functionalization and custom applications. The overall gold coating ensures inertness and electrical conductivity, as well as high and stable laser reflectivity in air, liquid and aggressive chemical environments. The tetrahedral tips are located precisely at the free ends of the cantilevers. This allows the tips to be positioned accurately over the area of interest on the sample surface.

Application Modes:

• Conductive AFM Probes
• Life Science AFM Probes
• Fluid Tapping AFM Probes

AFM Probe Specifications:

AFM Tips:

shape	tip height	tip set back	tip radius	full cone angle	half cone angle
OPUS	14 µm (12 - 16 µm)*	12 - 16 µm*	µm ( µm)*	< 30 nm		0° front, 35° back, <9° side

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
1Contact mode cantilever	Beam	500 µm (485 - 515 µm)*	30 µm (28 - 32 µm)*	3 µm (2.5 - 3.5 µm)*	0.3 N/m (0.1 - 0.6 N/m)*	17 kHz (11 - 22 kHz)*
2Soft AC mode cantilever	Beam	240 µm (225 - 255 µm)*	30 µm (28 - 32 µm)*	3 µm (2.5 - 3.5 µm)*	2.5 N/m (0.75 - 5.3 N/m)*	75 kHz (50 - 100 kHz)*
3Standard AC mode cantilever	Beam	175 µm (160 - 190 µm)*	40 µm (38 - 42 µm)*	3 µm (2.5 - 3.5 µm)*	9 N/m (2.8 - 21 N/m)*	150 µm (100 - 200 µm)*
4High frequency AC mode cantilever	Beam	65 µm (50 - 80 µm)*	31 µm (29 - 33 µm)*	3 µm (2.5 - 3.5 µm)*	100 N/m (35 - 215 N/m)*	1200 kHz (650 - 1850 kHz)*

* typical range

Coating:

70 nm Au on both sides of the cantilevers