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Order Code, Price (EUR/GBP) Items per set
FLAT 1 pcs
€ 690.00 £ 642.00 add to shopping cart

Product Availability: 5 - 10 working days

AFM Probe type:

Flatness Standard (FLAT)

Manufacturer: NANOSENSORS
Product Description:

The flatness standard consists of a superflat plane and is intended  to be used to analyze and correct the scanner bow of the piezo-scanner used in most Scanning Force Microscopes. The standard consists of a quartz substrate with a chromium layer.

The active area is located in the center of the chip and is surrounded by the FindMe structure.

This standard has been developed in close cooperation with the German national authority of standards: PTB (Physikalisch Technische Bundesanstalt). Due to this PTB is able to certify this standard in accordance with international guidelines. Please contact Working Group 5.25 Scanning Probe Metrology at directly.

maximum peak to valley (p-v) distance of 10 nm on a 100 by 100 µm2 area
available with certificate
FindMe pattern for easy localisation of active area
Chip size: 5x7 mm2
Thickness of the chip: approx. 2.3 mm
Active area: 200x200 µm2
FindMe structure: 1200x1200 µm2
Apex Probes Ltd., 12th Floor, Ocean House, The Ring, Bracknell, RG12 1AX, Phone: +44 (0)1344 388016
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