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Product Availability: 5 - 10 working days
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| Order | Request an official quote (RFQ) |
|---|
| Order Code, Price (EUR/GBP) | Probes per set |
|---|---|
| SSS-SEIH-10 | 10 pcs |
| € 776.00 £ 683.00 |
|
| SSS-SEIH-20 | 20 pcs |
| € 1389.00 £ 1222.00 |
|
| SSS-SEIH-50 | 50 pcs |
| € 3060.00 £ 2693.00 |
|
Product Availability: 5 - 10 working days
DANGER: One tiny amount of static electricity while you are handling these
probes will destroy the tip!
We highly recommend that you utilize an ESD
station and if you do not already have one, we have a mobile ESD station
for only £ ( EUR).
Considering the costs of these probes, this is a very wise investment.
AFM Probe type:
SSS-SEIH
Manufacturer: NANOSENSORS
(https://www.nanosensors.com)
Product Description:
For owners of a Seiko Instruments microscope using the non-contact mode we recommend the NANOSENSORS™ SEIH type (Seiko Instruments / high force constant). Compared with the ZEIH type the force constant is further reduced.For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.
The probe offers unique features:
- excellent tip radius of curvature
- typical aspect ratio at 200 nm from tip apex in the order of 3:1
- monolithic material
- highly doped silicon to dissipate static charge
- chemically inert
- high mechanical Q-factor for high sensitivity
- precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
- compatible with PointProbe® Plus XY-Alignment Series
Application Modes:
AFM Probe Specifications:
AFM Tips:
| shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|
| Supersharp | ( | < 2 nm (< 5 nm guaranteed) | < 10° at 200 nm from apex |
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| Beam | 225 µm (215 - 235 µm)* | 33 µm (25 - 40 µm)* | 5 µm (4 - 6 µm)* | 15 N/m (5 - 37 N/m)* | 130 kHz (96 - 175 kHz)* | ||
* guaranteed range
Probes Datasheets:
Datasheet for all sensors with sets of 10 or 20 sensors.Datasheet for up to 32 sensors with full wafer.
**ScanAsyst® and Peak Force Tapping® are registered trademarks of Bruker Corporation.
*** Olympus® is a trademark of Olympus Corporation.
Apex Probes Ltd., 12th Floor, Ocean House, The Ring, Bracknell, RG12 1AX, Phone: +44 (0)1344 388016